The 16th European Microscopy Congress 2016
Influence of background subtraction and deconvolution on calculation of EELS core-loss intensities
1. Dept of Electronic and Electrical Engineering, University of Sheffield, Sheffield, Royaume Uni
Quantitative analysis of electron energy-loss spectra (EELS) can be highly influenced by plural scattering for large thicknesses (t/λ>0.5) and background modelling. For quantification by integration…
Official abstracts site for the European Microscopy Congress