The 16th European Microscopy Congress 2016
Ion imaging in a Focused Ion Beam microscope: modeling the channeling contrast to construct EBSD-like orientation maps
Electron backscatter diffraction (EBSD) is routinely employed as a characterization tool to obtain individual grain orientations, local texture and phase identification. Efforts are currently being…The 16th European Microscopy Congress 2016
Ni-based superalloy: crystalline orientation mapping and gamma-gamma’ phases discrimination with the iCHORD method
Electron backscatter diffraction (EBSD) is routinely employed as a characterization tool to obtain individual grain orientations, local texture and phase identification. However, in the case…
Official abstracts site for the European Microscopy Congress