The 16th European Microscopy Congress 2016
Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation
1. School of Materials, University of Manchester, Manchester, Royaume Uni
Conventional Ga+ Focus Ion Beam (FIB) dual beam system has proven to be an important and popular tool for Transmission Electron Microscope (TEM) sample preparation…
Official abstracts site for the European Microscopy Congress