The 16th European Microscopy Congress 2016
In situ TEM electrical biasing studies on defect based crystal-amorphous transformation in GeTe nanowire devices
Germanium telluride (GeTe), a phase-change material, switches rapidly and reversibly between crystalline and amorphous phase. The crystalline to amorphous transformation pathway is based on melting…
Official abstracts site for the European Microscopy Congress