Articles tagged "corrector"

The 16th European Microscopy Congress 2016
Status of the SALVE-microscope: Cc-correction for atomic-resolution TEM imaging at 20kV
Martin Linck (1), Peter Hartel (1), Stephan Uhlemann (1), Frank Kahl (1), Heiko Müller (1), Joachim Zach (1), Johannes Biskupek (2), Marcel Niestadt (3), Ute Kaiser (2), Max Haider (1)
1. Corrected Electron Optical Systems GmbH, Heidelberg, Allemagne 2. Central facility of electron microscopy, Ulm University, Ulm, Allemagne 3. R&D, FEI Company, Eindhoven, Pays-Bas
With the goal to enable atomic resolution TEM observations on beam sensitive materials the SALVE project had been initiated to develop a dedicated low-voltage TEM…