The 16th European Microscopy Congress 2016
Composition quantification of thin samples by backscattered electron imaging in scanning electron microscopy
1. Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Allemagne
The contrast of backscattered electron (BSE) images in scanning electron microscopy can be exploited for atomic number or material density determination [1]. However, BSE images…
Official abstracts site for the European Microscopy Congress