The 16th European Microscopy Congress 2016
Clustering for scanning transmission electron diffraction data
1. Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, Royaume Uni
Modern scanning transmission electron microscopes (STEMs) routinely produce very large datasets with a variety of signals, ranging from conventional integrated scattering (annular bright- or dark-field),…The 16th European Microscopy Congress 2016
Atom probe tomography of early stage clustering in Al alloys
Nano-scaled early stage Si or Mg containing clusters in Al-Mg-Si alloys are experimentally extremely difficult to observe and atom probe tomography (APT) is the only…
Official abstracts site for the European Microscopy Congress