The 16th European Microscopy Congress 2016
Correlative ECCI and CL of single GaN microstructures obtained using ECP by beam rocking on small areas
SEM can be used to characterize the crystal structure at smooth surfaces, e.g. by mapping of electron channeling pattern (ECP). Layers of GaN grown on…The 16th European Microscopy Congress 2016
Quantifying transition radiation by employing CL and EELS
1. University Service Centre for TEM, TU Vienna, Vienna, Autriche
The excitation probability per incoming electron for transition radiation (TR) is measured by employing electron energy losses spectrometry (EELS) and cathodoluminescence (CL) in a transmission…The 16th European Microscopy Congress 2016
Combined stem-eels and stem-cl analysis of plasmonic coupling between chemically grown silver nanocubes
These recent years, study of surface plasmon resonances in transmission electron microscope has undergone an increasing interest. Indeed, low-loss EELS has proven its remarkable efficiency…The 16th European Microscopy Congress 2016
Optics at the nanoscale with fast electron spectroscopies
1. Laboratoire de Physique des Solides, CNRS, Orsay, France
Electron microscopy techniques have been used to probe the optical properties of materials in the subwavelength scale. In particular, it has been shown that using…
Official abstracts site for the European Microscopy Congress