Official abstracts site for the European Microscopy Congress
The 16th European Microscopy Congress 2016
Steffi Y Woo (1), Matthieu Bugnet (1, 2), Hieu P T Nguyen (3, 4), Songrui Zhao (3), Zetian Mi (3), Gianluigi A Botton (1)
1. Department of Materials Science and Engineering & Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Canada 2. MATEIS, UMR CNRS 5510, University of Lyon – INSA, Villeurbanne, France 3. Department of Electrical & Computer Engineering, McGill University, Montreal, Canada 4. Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, Etats-Unis