The 16th European Microscopy Congress 2016
Calculation of phase contrast in Cc/Cs-corrected STEM
1. Electron Microscopy Group of Materials Science, University of Ulm, Ulm, Allemagne
For STEM imaging, the pattern on the detector is a result of interference between elastically scattered wave and the incident wave. By recording the constructive…
Official abstracts site for the European Microscopy Congress