Articles tagged "BSE contrast"

The 16th European Microscopy Congress 2016
Backscattered-electron SEM contrast of SiO2 nanoparticles
Thomas Kowoll (1), Erich Mueller (1), Dagmar Gerthsen (1)
1. Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), Karlsruhe, Allemagne
Scanning electron microscopy (SEM) is frequently used for the characterization of nanoparticles (NPs) and imaging with backscattered electrons (BSEs) is particularly interesting to reveal, e.g.,…