The 16th European Microscopy Congress 2016
MEMS-based system for in-situ biasing and heating solutions inside the TEM
1. DENSsolutions, Delft, Pays-Bas
Understanding the thermo-electrical properties of different materials demands an in-depth analysis of their structure-property relationship. Therefore, monitoring their dynamic mechanisms in a real-world environment is…The 16th European Microscopy Congress 2016
Concepts for an electrostatic phase shifting device
The advantage of providing amplitude and phase information of an object exit-wave makes off-axis electron holography a powerful tool for analyzing field and potential distributions…
Official abstracts site for the European Microscopy Congress