Articles tagged "beam-induced damage"

The 16th European Microscopy Congress 2016
Simultaneous Nanoplasmonic Sensing and Transmission Electron Microscopy Characterization
Beniamino Iandolo (1), Asger Moss (1), Ferry Nugroho (2), Christoph Langhammer (2), Jakob Wagner (1)
1. Center for Electron Nanoscopy, Technical University of Denmark, Kgs. Lyngby, Danemark 2. Department of Physics, Chalmers University of Technology, Göteborg, Suède
We have developed a platform that allows for real time optical sensing based on localized surface plasmon resonance (LSPR) readout inside a transmission electron microscope…