The 16th European Microscopy Congress 2016
Can quantum wave filters outperform image processing?
1. EMAT, Department of Physics, University of Antwerp, Antwerp, Belgique
As electron microscopists, we are often limited by both low contrast, and high-noise levels forbeam-sensitive materials. The contrast is a function of the imaging technique,…The 16th European Microscopy Congress 2016
Effects of electron-beam-generated anion point defects on the long range order of charge density waves in 1T-TaSe2, 1T-TaS2
Charge density waves (CDW) are periodic modulations of charge density in low-dimensional metals observed as a function of temperature, doping and pressure. Due to electron-phonon…
Official abstracts site for the European Microscopy Congress