The 16th European Microscopy Congress 2016
EELS Investigation of the Work Function Reduction in Au decorated ZnO Nanotapers
The study of field emission (FE) from one dimensional (1D) nanostructures is emerging as a promising technology that can make a considerable contribution in the…The 16th European Microscopy Congress 2016
Gap measurements via low-loss EELS on atomically thin MoxW(1-x)S2 nanoflakes
The properties of alloyed materials are a fundamental issue in Materials Science. For years, layered semiconductors of the TX2 type (T=Mo, W; X=S, Se, Te)…The 16th European Microscopy Congress 2016
Diamond-based MOSFETs: Bandgap interface profiling by STEM-EELS
In the view of developing high performance metal-oxide-diamond field effect transistor (diamond MOSFET), recent reports presents different approach in the choice of the gate material…
Official abstracts site for the European Microscopy Congress