The 16th European Microscopy Congress 2016
Site-specific 35-minute TEM-lamella preparation by FIB-SEM
1. Materials Science, FEI Company, Eindhoven, Pays-Bas
Sample preparation by DualBeam (FIB-SEM) allows site specific TEM lamella to be prepared and is the number one use case for such instruments worldwide. This…
Official abstracts site for the European Microscopy Congress