Articles tagged "Atomic-Plane Resolution"

The 16th European Microscopy Congress 2016
Atomic plane resolution EMCD measurement by STEM-EELS under 3-beam diffraction condition
Jan Rusz (1), Shunsuke Muto (2), Jakob Spiegelberg (1), Roman Adam (3), Daniel E. Bürgler (3), Claus M. Schneider (3)
1. Department of Physics and Astronomy, Uppsala University, Uppsala, Suède 2. Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japon 3. Peter Grünberg Institut, Forschungszentrum Jülich GmbH, Jülich, Allemagne
Electron magnetic circular dichroism (EMCD) in the transmission electron microscope (TEM) is a relatively immature experimental technique, though it has already demonstrated quantitative results…