Articles tagged "Atomic force microscopy (AFM)"

The 16th European Microscopy Congress 2016
Investigation of the near fields of sputtered Au thin films, used for surface enhanced Raman spectroscopy, using the AFM and DDA
Harald Fitzek (1), Jürgen Sattelkow (1), Peter Pölt (1, 2)
1. Institute for Electron Microscopy and Nanoanalysis (FELMI), Graz University of Technology, Graz, Autriche 2. Graz Centre for Electron microscopy, Austrian Cooperative Research, Graz, Autriche
Surface enhanced Raman spectroscopy (SERS) is a powerful technique that uses metal nanostructures (Au, Ag, Cu) to gain in the best case single molecule sensitivity…