The 16th European Microscopy Congress 2016
Improvement of 3D atom probe tomography reconstruction integrating transmission electron microscopy information
We propose to improve atom probe tomography (APT) reconstruction methods to increase the reliability and the accuracy of the resulting 3D volumes. Currently, 3D reconstructions…The 16th European Microscopy Congress 2016
Analytical electron microscopy and atom probe tomography investigation of interfacial segregation
The chemistry of internal interfaces plays a key role in modern physical metallurgy, in particular for the development of the new generations of steels. Despite…The 16th European Microscopy Congress 2016
ATOM-PROBE TOMOGRAPHY AND NANOSCIENCES
1. GPM, Normandie Université, Rouen, France 2. LETI, CEA, Grenoble, France
The design of Atom probe tomography (APT) at Oxford and Rouen universities 25 years ago has been an outstanding breakthrough in the microscopy world. APT…The 16th European Microscopy Congress 2016
Counter Electrode Design Considerations in Atom Probe Tomography Microscopes
1. CAMECA Instruments Inc., Madison WI, Etats-Unis
In the development of atom probe tomography instruments, a variety of counter electrode designs have been considered. Each design takes into account a wide variety…The 16th European Microscopy Congress 2016
Multidimensional Analysis of Local Compositional and Valence Fluctuations in the Model Complex Oxide La2MnNiO6
Propelled by rapid advances in synthesis, characterization, and computational modeling, materials science is fast progressing toward a “materials-by-design” paradigm. While we can envision a very…The 16th European Microscopy Congress 2016
Atom probe tomography of early stage clustering in Al alloys
Nano-scaled early stage Si or Mg containing clusters in Al-Mg-Si alloys are experimentally extremely difficult to observe and atom probe tomography (APT) is the only…The 16th European Microscopy Congress 2016
Kinetics of precipitation in new generation of cobalt-based superalloys
Kinetics of precipitation in new generation of cobalt-based superalloys A. Azzam, T. Philippe, F. Danoix, A. Hauet, D. Blavette Normandie Université, Groupe de Physique…The 16th European Microscopy Congress 2016
Correlative atom probe tomography and electron microscopy on energy materials
We present recent progress in correlative methods for the joint analysis of samples by Atom Probe Tomography (LEAP 3000, LEAP 5000) and Electron Microscopy (Cs…The 16th European Microscopy Congress 2016
Factors limiting the doping efficiency in atomic layer deposited ZnO:Al thin films: a dopant distribution study by transmission electron microscopy and atom probe tomography
Transparent conducting oxides (TCOs), such as indium tin oxide (ITO), are commonly used as transparent electrodes in a wide variety of devices, such as in…
Official abstracts site for the European Microscopy Congress