Articles tagged "annular dark-field imaging"

The 16th European Microscopy Congress 2016
Quantitative annular dark-field imaging at atomic resolution
Shunsuke Yamashita (1), Shogo Koshiya (1), Kazuo Ishizuka (2), Koji Kimoto (1)
1. Electron Microscopy Group, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japon 2. HREM Research Inc., 14-48 Matsukazedai, Higashimatsuyama, Saitama, Japon
Quantitative annular dark-filed (ADF) imaging in scanning transmission electron microscopy (STEM) enables us to identify the type and number of atoms of local crystal structures.…