Articles tagged "angle resolved EELS"

The 16th European Microscopy Congress 2016
Near Band Edge excitation in 2D materials by Transmission Electron Microscopy
Frédéric Fossard (1), Léonard Schué (1, 2), Etienne Gaufrès (1, 3), Amandine Andrieux (1), François Ducastelle (1), Annick Loiseau (1)
1. Laboratoire d'Etude des Microstructures, CNRS - ONERA, Chatillon, France 2. GEMAC, Université Versailles-Saint Quentin - CNRS, Versailles, France 3. RQMP, Université de Montréal, Montréal, Canada
In this work, we report on the characterization of near band edge excitation by electron energy loss spectroscopy (EELS). This technique is operated in a…
The 16th European Microscopy Congress 2016
Spectroscopy on Black Phosphorus exfoliated down to the monolayer
Etienne Gaufrès (1, 2), Alexandre Favron (2), Frédéric Fossard (1), Pierre Lévesque (2), Anne-Laurence Phaneuf-L'Heureux (3), Sébastien Francoeur (3), Richard Martel (2), Annick Loiseau (1)
1. Laboratoire d'Etude des Microstructures, CNRS - ONERA, Chatillon, France 2. RQMP, Université de Montréal, Montréal, Canada 3. RQMP, Ecole Polytechnique de Montréal, Montréal, Canada
Black Phosphorus (P(black)) is a 2D semiconductor characterized by a direct band gap associated to high carriers mobility. The crystal is composed by tetravalent P…