The 16th European Microscopy Congress 2016
En route to ion microprobe analysis of soluble compounds at the single cell level: The CryoNanoSIMS
The NanoSIMS 50L instrument is a magnetic-sector, multi-collecting ion probe. The physical basis for ion micro-probe analysis is the ability to perform mass-spectrometry on secondary…The 16th European Microscopy Congress 2016
3D surface reconstruction with segmented BSE detector: New improvements and application for fracture analysis in SEM
Using the signals of four backscattered electron (BSE) detectors with different detection angles in the scanning electron microscope (SEM) the three-dimensional surface topography of various…