Articles tagged "aberration-correction"

The 16th European Microscopy Congress 2016
Determining atomic coordinates in 3D by atomic electron tomography
Peter Ercius (1), Rui Xu (2), Chien-Chun Chen (2), Li Wu (2), Mary Scott (1, 2), Wolfgang Theis (3), Colin Ophus (1), Jungwon Park (4, 5), Hans Elmlund (6, 7), Alex Zettl (8, 9), A. Paul Alivisatos (4, 9), Jianwei Miao (2, 10)
1. Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, Etats-Unis 2. Department of Physics & Astronomy, University of California, Los Angeles, Etats-Unis 3. School of Physics and Astronomy, University of Birmingham, Birmingham, Royaume Uni 4. Department of Chemistry, University of California, Berkeley, Etats-Unis 5. Department of Applied Physics, Harvard University, Cambridge, Etats-Unis 6. School of Biomedical Sciences, Monash University, Clayton, Australie 7. Centre for Advanced Molecular Imaging, ARC Centre of Excellence, Clayton, Australie 8. Department of Physics, University of California, Berkeley, Etats-Unis 9. Kavli Energy NanoScience Institute, Berkeley, Etats-Unis 10. California NanoSystems Institute, University of California, Los Angeles, Etats-Unis
At a basic level, materials properties depend on the three-dimensional arrangement of atoms, and it is necessary to determine their coordinates to make correlative measurements…
The 16th European Microscopy Congress 2016
STEM optical sectioning for imaging screw dislocation core structures
David Hernandez-Maldonado (1), Hao Yang (2), Lewys Jones (3), Roman Gröger (4), Peter B Hirsch (3), Quentin M Ramasse (1), Peter D Nellist (3)
1. SuperSTEM , STFC Daresbury Laboratories, Daresbury, Royaume Uni 2. Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory, California, Etats-Unis 3. Department of Materials, University of Oxford, Oxford, Royaume Uni 4. Multiscale Modelling and Measurements of Physical Properties, Institute of Physics of Materials ASCR and CEITEC IPM, Brno, République tchèque
The introduction of spherical-aberration correctors in STEM has allowed an improvement in spatial resolution up to the sub-angstrom scale also accompanied by a reduction of…
The 16th European Microscopy Congress 2016
Imaging of Electron Beam Triggered Phase Transformations and Chemical Reactions of Organic Molecules by Aberration-Corrected Low-Voltage Transmission Electron Microscopy
Johannes Biskupek (1), Thomas Chamberlain (2, 3), Stephen Skowron (4), Elena Besley (2), Andrei Khlobystov (2), Ute Kaiser (1)
1. Central Facility of Electron Microscopy, University of Ulm, Ulm, Allemagne 2. School of Chemistry, University of Nottingham, Nottingham, Royaume Uni 3. Institute of Process Research and Development, School of Chemistry, University of Leeds, Leeds, Royaume Uni 4. School of Chemistry, University of Nottingham, Leeds, Royaume Uni
Direct observation of organic single-molecules in their pristine state using transmission electron microscopy (TEM) is a challenging task because the electron irradiation during high-resolution imaging…
The 16th European Microscopy Congress 2016
Status of the SALVE-microscope: Cc-correction for atomic-resolution TEM imaging at 20kV
Martin Linck (1), Peter Hartel (1), Stephan Uhlemann (1), Frank Kahl (1), Heiko Müller (1), Joachim Zach (1), Johannes Biskupek (2), Marcel Niestadt (3), Ute Kaiser (2), Max Haider (1)
1. Corrected Electron Optical Systems GmbH, Heidelberg, Allemagne 2. Central facility of electron microscopy, Ulm University, Ulm, Allemagne 3. R&D, FEI Company, Eindhoven, Pays-Bas
With the goal to enable atomic resolution TEM observations on beam sensitive materials the SALVE project had been initiated to develop a dedicated low-voltage TEM…
The 16th European Microscopy Congress 2016
Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector
Ryusuke Sagawa (1), Hao Yang (2), Lewys Jones (3), Martin Simson (4), Martin Huth (4), Heike Soltau (4), Peter Nellist (3), Yukihito Kondo (1)
1. EM Business Unit, JEOL Ltd., Tokyo, Japon 2. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, California, Etats-Unis 3. Department of Materials, University of Oxford, Oxford, Royaume Uni 4. PNDetector, PNDetector GmbH, München, Allemagne
In scanning transmission electron microscopy (STEM), one can obtain a variety of STEM images such as bright-field (BF) and annular dark-field (ADF) STEM images by…
The 16th European Microscopy Congress 2016
3D Fourier transform analysis and Diffractogram analysis to evaluate a high-performance TEM
Kazuo Ishizuka (1, 2), Koji Kimoto (2, 3)
1. R&D, HREM Research Inc., Higashimatsuyama, Japon 2. Advanced Key Technologies Division, National Institute for Materials Science, Tsukuba, Japon 3. Department of Applied Chemistry, Kyushu University, Tsukuba, Japon
The resolution of HRTEM has been improved down to sub-angstrom by correcting the spherical aberration (Cs) of the objective lens, and the information limit is…
The 16th European Microscopy Congress 2016
Measurement of Diffraction Pattern Distortions for Quantitative STEM
Florian F. Krause (1, 2), Marco Schowalter (1, 2), Tim Grieb (1, 2), Knut Müller-Caspary (1, 2), Thorsten Mehrtens (1, 2), Andreas Rosenauer (1, 2)
1. Institut für Festkörperphysik, Universität Bremen, Bremen, Allemagne 2. MAPEX Center for Materials and Processes, Universität Bremen, Bremen, Allemagne
The shape and sensitivity distribution of the detector used for the acquisition of STEM micrographs is of the utmost importance for the accuracy of quantitative…
The 16th European Microscopy Congress 2016
Performance of the SALVE III corrector for EFTEM applications
Frank Kahl (1), Martin Linck (1), Peter Hartel (1), Heiko Mueller (1), Stephan Uhlemann (1), Max Haider (1), Joachim Zach (1)
1. Research & Development, CEOS GmbH, Heidelberg, Allemagne
The Sub-Angstroem-Low-Voltage-Electron-Microscope (SALVE) corrector was designed and built by the CEOS GmbH for the SALVE III project [1], a joined project of the group of…
The 16th European Microscopy Congress 2016
Imaging interactions of iron oxide nanoparticles with organic ligands and the biological environment
Duncan Alexander (1), Débora Bonvin (2), Ulrich Aschauer (3), Heinrich Hofmann (2), Marijana Mionic Ebersold (2, 4)
1. Interdisciplinary Centre for Electron Microscopy (CIME), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Suisse 2. Powder Technology Laboratory (LTP), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Suisse 3. Department of Chemistry and Biochemistry, University of Bern, Bern, Suisse 4. Department of Radiology, University Hospital Lausanne (CHUV) and University of Lausanne (UNIL), Lausanne, Suisse
Applications of nanoparticles for chemistry, biochemistry and biomedicine require a detailed understanding of the nature of the nanoparticles and of their surface interactions with both…
The 16th European Microscopy Congress 2016
Properties of low-dimensional electron-beam-sensitive objects by spherical and chromatic aberration-corrected low-voltage high-resolution transmission electron microscopy and spectroscopy
Ute Kaiser (1)
1. Central Facility of Electron Microscopy, Ulm University, Ulm, Allemagne
Spherical aberration correction has become inevitable in materials science for atomic-resolution imaging of conventional objects by transmission electron microscopy at medium accelerating voltages (80-300kV). However,…