The 16th European Microscopy Congress 2016
Determining atomic coordinates in 3D by atomic electron tomography
At a basic level, materials properties depend on the three-dimensional arrangement of atoms, and it is necessary to determine their coordinates to make correlative measurements…The 16th European Microscopy Congress 2016
STEM optical sectioning for imaging screw dislocation core structures
The introduction of spherical-aberration correctors in STEM has allowed an improvement in spatial resolution up to the sub-angstrom scale also accompanied by a reduction of…The 16th European Microscopy Congress 2016
Imaging of Electron Beam Triggered Phase Transformations and Chemical Reactions of Organic Molecules by Aberration-Corrected Low-Voltage Transmission Electron Microscopy
Direct observation of organic single-molecules in their pristine state using transmission electron microscopy (TEM) is a challenging task because the electron irradiation during high-resolution imaging…The 16th European Microscopy Congress 2016
Status of the SALVE-microscope: Cc-correction for atomic-resolution TEM imaging at 20kV
With the goal to enable atomic resolution TEM observations on beam sensitive materials the SALVE project had been initiated to develop a dedicated low-voltage TEM…The 16th European Microscopy Congress 2016
Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector
In scanning transmission electron microscopy (STEM), one can obtain a variety of STEM images such as bright-field (BF) and annular dark-field (ADF) STEM images by…The 16th European Microscopy Congress 2016
3D Fourier transform analysis and Diffractogram analysis to evaluate a high-performance TEM
The resolution of HRTEM has been improved down to sub-angstrom by correcting the spherical aberration (Cs) of the objective lens, and the information limit is…The 16th European Microscopy Congress 2016
Measurement of Diffraction Pattern Distortions for Quantitative STEM
The shape and sensitivity distribution of the detector used for the acquisition of STEM micrographs is of the utmost importance for the accuracy of quantitative…The 16th European Microscopy Congress 2016
Performance of the SALVE III corrector for EFTEM applications
1. Research & Development, CEOS GmbH, Heidelberg, Allemagne
The Sub-Angstroem-Low-Voltage-Electron-Microscope (SALVE) corrector was designed and built by the CEOS GmbH for the SALVE III project [1], a joined project of the group of…The 16th European Microscopy Congress 2016
Imaging interactions of iron oxide nanoparticles with organic ligands and the biological environment
Applications of nanoparticles for chemistry, biochemistry and biomedicine require a detailed understanding of the nature of the nanoparticles and of their surface interactions with both…The 16th European Microscopy Congress 2016
Properties of low-dimensional electron-beam-sensitive objects by spherical and chromatic aberration-corrected low-voltage high-resolution transmission electron microscopy and spectroscopy
1. Central Facility of Electron Microscopy, Ulm University, Ulm, Allemagne
Spherical aberration correction has become inevitable in materials science for atomic-resolution imaging of conventional objects by transmission electron microscopy at medium accelerating voltages (80-300kV). However,…