Articles tagged "Aberration Corrected"

The 16th European Microscopy Congress 2016
Low Voltage Imaging of Defects in 2D-Quantum Materials
David Bell (1, 2), Felix VonCube (1, 3)
1. School of Engineering and Applied Sciences, Harvard University, Cambridge, Etats-Unis 2. Center for Nanoscale Systems, Harvard University, Cambridge , Etats-Unis 3. Hitachi High Technologies , Mannheim, Allemagne
The discovery of extraordinary new quantum materials with striking properties has caused great excitement, and promises to transform signal processing and computation. We have performed…
The 16th European Microscopy Congress 2016
atomic-resolution analysis of the structure and dopants of beam sensitive ordered porous materials
Alvaro Mayoral (1), Jennifer Readman (2), Marta Navarro (1), Russell E. Morris (3), Isabel Díaz (4)
1. Nanoscience Institute of Aragon (INA), University of Zaragoza, Zaragoza, Espagne 2. School of Physical Sciences and Computing, University of Central Lancashire, Preston, Royaume Uni 3. 4EaStCHEM School of Chemistry, University of St Andrews, St Andrews, Royaume Uni 4. Instituto de Calasis y Petroleoquimica, CSIC, Madrid, Espagne
With the modern transmission electron microscopes (TEM) sub-angstrom resolution has become readily achievable overcoming the lateral resolution problem. However, there are many cases where its…
The 16th European Microscopy Congress 2016
Real structure of highly oriented Ge-Sb-Te thin films investigated by Cs-corrected STEM
Ulrich Ross (1), Andriy Lotnyk (1), Erik Thelander (1), Bernd Rauschenbach (1)
1. Leibniz Institute of Surface Modification (IOM), Leipzig, Allemagne
The phase-change effect in a wide class of tellurium-based chalcogenide compounds allows for the fast and reversible transition between crystalline and amorphous states that possess…