The 16th European Microscopy Congress 2016
Low Voltage Imaging of Defects in 2D-Quantum Materials
The discovery of extraordinary new quantum materials with striking properties has caused great excitement, and promises to transform signal processing and computation. We have performed…The 16th European Microscopy Congress 2016
atomic-resolution analysis of the structure and dopants of beam sensitive ordered porous materials
With the modern transmission electron microscopes (TEM) sub-angstrom resolution has become readily achievable overcoming the lateral resolution problem. However, there are many cases where its…The 16th European Microscopy Congress 2016
Real structure of highly oriented Ge-Sb-Te thin films investigated by Cs-corrected STEM
1. Leibniz Institute of Surface Modification (IOM), Leipzig, Allemagne
The phase-change effect in a wide class of tellurium-based chalcogenide compounds allows for the fast and reversible transition between crystalline and amorphous states that possess…