The 16th European Microscopy Congress 2016
Performances of aberration-corrected monochromatic low-voltage analytical electron microscope
To study the detailed electronic structures of carbon-related materials at an energy resolution better than 25 meV, we have developed a monochromatic low-voltage analytical electron…The 16th European Microscopy Congress 2016
Improved Quantitative Compositional Analysis of γ’ and γ’’ in Additively Manufactured Alloy 718 Using STEM X-ray Energy Dispersive Spectrometry
Selective laser melting (SLM) is an additive manufacturing technique where successive laser beam passes are used to melt metal powder which forms a solid layer…The 16th European Microscopy Congress 2016
Colloidal Quantum-Dot Heterostructures Studied Using Aberration-Corrected Scanning Transmission Electron Microscopy
Complex colloidal semiconductor quantum- dot heterostructures, such as core/shell or core/crown nanoplatelets, can now be readily synthesized [1-4]. Such heterostructures significantly enhance the optical properties…The 16th European Microscopy Congress 2016
Control of Polarity, Structure and Growth Direction in Sn-Seeded GaSb Nanowires
Among III-V semiconductor materials GaSb is highly interesting for several device applications such as optoelectronics.1 The epitaxial growth of GaSb nanowires has mainly been done…