The 16th European Microscopy Congress 2016
Performances of aberration-corrected monochromatic low-voltage analytical electron microscope
To study the detailed electronic structures of carbon-related materials at an energy resolution better than 25 meV, we have developed a monochromatic low-voltage analytical electron…The 16th European Microscopy Congress 2016
Improved Quantitative Compositional Analysis of γ’ and γ’’ in Additively Manufactured Alloy 718 Using STEM X-ray Energy Dispersive Spectrometry
Selective laser melting (SLM) is an additive manufacturing technique where successive laser beam passes are used to melt metal powder which forms a solid layer…The 16th European Microscopy Congress 2016
Colloidal Quantum-Dot Heterostructures Studied Using Aberration-Corrected Scanning Transmission Electron Microscopy
Complex colloidal semiconductor quantum- dot heterostructures, such as core/shell or core/crown nanoplatelets, can now be readily synthesized [1-4]. Such heterostructures significantly enhance the optical properties…The 16th European Microscopy Congress 2016
Control of Polarity, Structure and Growth Direction in Sn-Seeded GaSb Nanowires
Among III-V semiconductor materials GaSb is highly interesting for several device applications such as optoelectronics.1 The epitaxial growth of GaSb nanowires has mainly been done…
Official abstracts site for the European Microscopy Congress