The 16th European Microscopy Congress 2016
Optimisation of TEM preparation in metallic materials using low voltage ions
TEM samples of metallic materials can be prepared by mainly two ways: Electrothinning and ion thinning either by ion milling systems or Focused Ion Beam…The 16th European Microscopy Congress 2016
HRTEM, HREELS analyses and modelling of nanometric oxide layers formed on 316L in simulated Pressurized Water Reactor (PWR) conditions
The development of a passivation layer on stainless steels in Pressurized Water Reactor (PWR) environment is a key phenomenon in Stress Corrosion Cracking (SCC) behavior.…
Official abstracts site for the European Microscopy Congress