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The 16th European Microscopy Congress 2016 » Instrumentation and Methods

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

  • ‘Slice & View’ nano-tomography of porous media using FIB-SEM

    Yang Liu, Pierre Le Fur, Marijn van Huis, Oliver Plümper

  • 10 bar nanoreactors for in situ transmission electron microscopy

    Gregory Pandraud, Bruno Morana, Jia Wei, Casper Juffermans

  • 3-D EM exploration of the hepatic microarchitecture – lessons learned for large-volume in situ serial sectioning

    Gerald Shami, Delfine Cheng, Minh Huynh, Celien Vreuls, Eddie Wisse, Filip Braet

  • 3-D reconstruction of surface topography in SEM by means of energy filtered SE and BSE

    Stepan Kupreenko, Eduard Rau, Andrey Tatarintsev, Sergey Zaytsev

  • 3D characterization using transmission electron diffraction, neural network optimization, and density functional theory

    Robert S. Pennington, Christoph T. Koch

  • 3D elemental analysis of the rod-shape alloy by using EDS tomography

    Yoshitaka Aoyama, Hideo Nishioka, Yukihito Kondo

  • 3D Elemental and interdependent reconstructions based on a novel compressed sensing algorithm in electron tomography

    Tony Printemps, Nicolas Bernier, Eric Robin, Zineb Saghi, Lionel Hervé

  • 3D Fourier transform analysis and Diffractogram analysis to evaluate a high-performance TEM

    Kazuo Ishizuka, Koji Kimoto

  • 3D investigation of a PS/ABS polymer using different microscopy techniques

    X. Jaurand , E. Errazuriz , S. Reynaud , Th. Douillard , F. Dalmas , S. Descartes , F. Simonet , M. Mondon , I. Anselme-Bertrand

  • 3D Mapping of electric potentials and magnetic fields at the nanoscale using Electron Holographic Tomography

    Daniel Wolf, Axel Lubk, Hannes Lichte

  • 3D mapping of subcellular structures with super-resolution array tomography

    Sebastian Markert, Sebastian Britz, Sven Proppert, Marietta Lang, Daniel Witvliet, Ben Mulcahy, Markus Sauer, Mei Zhen, Jean-Louis Bessereau, Christian Stigloher

  • 3D Reconstruction of Crack Formation in Austempered Ductile Cast Iron after an In-situ Tensile Test

    Hana Tesařová, Jiří Dluhoš, Martin Petrenec, Jaroslav Polák, Karel Krahula

  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps

    Zhichao Zhong, Bart Goris, Remco Schoenmakers, Sara Bals, K. Joost Batenburg

  • 3D surface reconstruction with segmented BSE detector: New improvements and application for fracture analysis in SEM

    Matthias Hemmleb, Dirk Bettge, Iryna Driehorst, Dirk Berger

  • A closer look at high-resolution electron holography

    Tore Niermann, Michael Lehmann

  • A Compressive Sensing based acquisition design for quantitative ultra-low dose high-resolution imaging and spectroscopy in the STEM

    Dorothea Muecke-Herzberg, Patricia Abellan, Michael Sarahan, Iain Godfrey, Zineb Saghi, Rowan Leary, Andrew Stevens, Jackie Ma, Gitta Kutyniok, Feridoon Azough, Robert Freer, Paul Midgley, Nigel Browning, Quentin Ramasse

  • A Correlative Methodology based on SIMS for Advanced Materials Characterization

    Santhana Eswara, Rong Hu, Lluís Yedra, Jean-Nicolas Audinot, Alexander Schwedt, Cem Tasan, Joachim Mayer, Dierk Raabe, Tom Wirtz

  • A JEOL-based cooling holder with a low specimen drift allowing sub 1Å STEM imaging

    David Bell , Henny Zandbergen

  • A magnetic electron energy analyser for use in an SEM

    Christopher Walker, Mohamed El Gomati, Xiaoping Zha

  • A micro-combinatorial TEM method for phase mapping of thin two-component films

    György Sáfrán

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« View all sessions from the The 16th European Microscopy Congress 2016

Most Viewed Abstracts

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  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
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  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
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