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The 16th European Microscopy Congress 2016 » Instrumentation and Methods » Quantitative Diffraction

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Quantitative Diffraction

  • 3D characterization using transmission electron diffraction, neural network optimization, and density functional theory

    Robert S. Pennington, Christoph T. Koch

  • A new method to orient samples by STEM in a scanning electron microscope

    Cheng Sun, Erich Müller, Dagmar Gerthsen

  • Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis

    Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, Kerstin Volz

  • Applying of Electron Backscatter Diffraction (EBSD) for Studying Structural and Phase Composition of Multilayer CrN/MoN Coatings Fabricated by Arc-PVD

    Bogdan Postolnyi, João Pedro Araújo, Alexander Pogrebnjak

  • Atomic-level elastic strain measurement of amorphous materials by quantification of local selected area electron diffraction patterns

    Christian Ebner, Rohit Sarkar, Jagannathan Rajagopalan, Christian Rentenberger

  • Cations distribution in synthetic (MgFe2O4 and FeAl2O4) spinels by precession electron diffraction tomography

    NGASSA TANKEU Yvan Georges, JACOB Damien, ROUSSEL Pascal, ROSKOSZ Mathieu, ANDREOZZI Giovanni B.

  • Clustering for scanning transmission electron diffraction data

    Ben Martineau, Alexander Eggeman

  • Deformation mapping in a TEM: Dark Field Electron Holography, Nanobeam Electron Diffraction, Precession Electron Diffraction and GPA compared.

    David Cooper, Nicolas Bernier, Jean-Luc Rouviere

  • Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phase Retrieval of Electron Rocking Curves

    Saitoh Koh, Miura Masashi, Tanaka Nobuo, Nakatsuka Osamu, Zaima Shigeaki

  • Electron diffractive imaging using fork-shaped grating masks

    Saitoh Koh, Nambu Hiroki, Uchida Masaya

  • First woven covalent organic framework solved using electron crystallography

    Yuzhong Liu, Yanhang Ma, Yingbo Zhao, Peter Oleynikov, Osamu Terasaki, Omar Yaghi

  • Indexation of diffraction patterns for overlapping crystals in TEM thin foils – Application to orientation mappings

    Alexia Valery, Frederic Lorut, Laurent Clément, Edgar Rauch

  • Interpretation of phase structures using the program “DiffraCalc” and EDX-spectrometry

    Evgenia Kuleshova, Alexey Frolov, Ekaterina Krikun

  • Inversion of dynamical scattering from large-angle rocking-beam electron diffraction patterns

    Feng Wang, Robert Pennington, Christoph Koch

  • Investigation of structural changes of ZnO:Ti thin films prepared by RF sputtering

    Rostislav Medlín, Pavol Sutta, Marie Netrvalova, Petr Novak

  • Large area orientation mapping on nanoscale materials using SEM

    Laurie Palasse, Daniel Goran

  • Measurement of strain in nanoporous gold using nano-beam electron diffraction

    Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Anastasia Lackmann, Arne Wittstock, Andreas Rosenauer

  • Nanoscale Crystal Cartography using Scanning Electron Diffraction

    Paul Midgley, Duncan Johnstone, Sung-Jin Kang, Alex Eggeman

  • Optimization of NBED simulations to accurately predict disc-detection measurements

    Tim Grieb, Florian Fritz Krause, Christoph Mahr, Knut Müller-Caspary, Dennis Zillmann, Marco Schowalter, Andreas Rosenauer

  • Pixelated STEM detectors: opportunities and challenges

    Ian MacLaren, Magnus Nord, Andrew Ross, Matus Krajnak, Martin Hart, Alastair Doye, Damien McGrouther, Rantej Bali, Archan Banerjee, Robert Hadfield

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