The 16th European Microscopy Congress 2016 » Instrumentation and Methods » Quantitative Diffraction
Meeting: The 16th European Microscopy Congress 2016
Session: Instrumentation and Methods
Topic: Quantitative Diffraction
3D characterization using transmission electron diffraction, neural network optimization, and density functional theory
A new method to orient samples by STEM in a scanning electron microscope
Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis
Applying of Electron Backscatter Diffraction (EBSD) for Studying Structural and Phase Composition of Multilayer CrN/MoN Coatings Fabricated by Arc-PVD
Atomic-level elastic strain measurement of amorphous materials by quantification of local selected area electron diffraction patterns
Cations distribution in synthetic (MgFe2O4 and FeAl2O4) spinels by precession electron diffraction tomography
Clustering for scanning transmission electron diffraction data
Deformation mapping in a TEM: Dark Field Electron Holography, Nanobeam Electron Diffraction, Precession Electron Diffraction and GPA compared.
Determination of a 3D Displacement Field at a Vicinity of a GeSn/Ge Interface by the Phase Retrieval of Electron Rocking Curves
Electron diffractive imaging using fork-shaped grating masks
First woven covalent organic framework solved using electron crystallography
Indexation of diffraction patterns for overlapping crystals in TEM thin foils – Application to orientation mappings
Interpretation of phase structures using the program “DiffraCalc” and EDX-spectrometry
Inversion of dynamical scattering from large-angle rocking-beam electron diffraction patterns
Investigation of structural changes of ZnO:Ti thin films prepared by RF sputtering
Large area orientation mapping on nanoscale materials using SEM
Measurement of strain in nanoporous gold using nano-beam electron diffraction
Nanoscale Crystal Cartography using Scanning Electron Diffraction
Optimization of NBED simulations to accurately predict disc-detection measurements
Pixelated STEM detectors: opportunities and challenges
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