The 16th European Microscopy Congress 2016 » Instrumentation and Methods » New Instrumentation
Meeting: The 16th European Microscopy Congress 2016
Session: Instrumentation and Methods
Topic: New Instrumentation
Spin polarisation with electron Bessel beams?
Spin-multislice simulation of an electron inside the objective lens of a TEM
Status of the SALVE-microscope: Cc-correction for atomic-resolution TEM imaging at 20kV
Surface-sensitive investigation of semiconductor devices with a signal-selective SEM detection system
Temporally and spatially resolved local strain tracking microscopy
The concept of quantum electron microscopy.
THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes
Three-dimensional nanomechanical spectroscopy of soft matter-liquid interfaces
Time-resolved cathodoluminescence in a scanning electron microscope
Transmission imaging of biological tissue with the Delft multi-beam SEM
Transmission Kikuchi Diffraction: effective nano-scale analysis using conventional EBSD hardware
Transmission Mode in the SEM: Direct measurement of charge load up, secondary electron yield and backscattering coefficient in dependence on the energy of the incident electrons
Ultra-High Resolution SEM for Materials Analysis
Ultrafast nano-fabrication and analysis using Xe plasma-FIB-SEM microscope and its applications for Cu milling using the Rocking-stage
Ultrafast transmission electron microscopy reveals electron dynamics and trajectories in a thermionic gun setup
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