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The 16th European Microscopy Congress 2016 » Instrumentation and Methods » New Instrumentation

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: New Instrumentation

  • Spin polarisation with electron Bessel beams?

    Peter Schattschneider, Vincenzo Grillo, Thomas Schachinger, Stefan Löffler

  • Spin-multislice simulation of an electron inside the objective lens of a TEM

    Vincenzo Grillo, Thomas Schachinger, Ebrahim Karimi, Peter Schattschneider

  • Status of the SALVE-microscope: Cc-correction for atomic-resolution TEM imaging at 20kV

    Martin Linck, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Johannes Biskupek, Marcel Niestadt, Ute Kaiser, Max Haider

  • Surface-sensitive investigation of semiconductor devices with a signal-selective SEM detection system

    Jaroslav Jiruše, Jolana Kološová, Petr Mareš, Rostislav Váňa

  • Temporally and spatially resolved local strain tracking microscopy

    Halil Bayraktar, Onur Aydin, Bekir Aksoy, Ozge Begum Akalin, B. Erdem Alaca

  • The concept of quantum electron microscopy.

    Pieter Kruit, Karl Berggren, Peter Hommelhoff, Mark Kasevich

  • THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes

    Ivo Burkart, Eva Burkart, Volker Klocke, David Peters

  • Three-dimensional nanomechanical spectroscopy of soft matter-liquid interfaces

    Ricardo Garcia

  • Time-resolved cathodoluminescence in a scanning electron microscope

    Sophie Meuret, Hans Zeijlemaker, Elke Neu, Patrick Appel, Patrick Maletinsky, Albert Polman

  • Transmission imaging of biological tissue with the Delft multi-beam SEM

    Wilco Zuidema, Yan Ren, Jacob Hoogenboom, Cees Hagen, Pieter Kruit

  • Transmission Kikuchi Diffraction: effective nano-scale analysis using conventional EBSD hardware

    Jenny Goulden, Haithem Mansour, Angus Bewick

  • Transmission Mode in the SEM: Direct measurement of charge load up, secondary electron yield and backscattering coefficient in dependence on the energy of the incident electrons

    Bianca Jaud, Jörg Bernhard, Ute Kaiser, Ute Golla-Schindler

  • Ultra-High Resolution SEM for Materials Analysis

    Jaroslav Jiruše, Miloslav Havelka, Jan Polster

  • Ultrafast nano-fabrication and analysis using Xe plasma-FIB-SEM microscope and its applications for Cu milling using the Rocking-stage

    Abdelmalek Benkouider, Sharang Sharang, Tomaš Hrnčíř, Jozef Vincenc Oboňa, Jaroslav Jiruše, Edward Principe

  • Ultrafast transmission electron microscopy reveals electron dynamics and trajectories in a thermionic gun setup

    Kerstin Bücker, Matthieu Picher, Olivier Crégut, Thomas LaGrange, Bryan Reed, Sang Tae Park, Dan Masiel, Florian Banhart

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« View all sessions from the The 16th European Microscopy Congress 2016

Most Viewed Abstracts

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