EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

The 16th European Microscopy Congress 2016 » Instrumentation and Methods » New Instrumentation

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: New Instrumentation

  • Beyond elemental analysis in the electron microscope: accessing isotopes with in-situ TEM-SIMS correlative analysis.

    Lluis Yedra, Santhana Eswara, David Dowsett, Tom Wirtz

  • Cathodoluminescence microscopy of biological samples for correlative light and electron microscopy (CLEM) using organic fluorophores

    Christopher Schmid, Klaus Yserentant, Lucian Stefan, Dirk-Peter Herten, Rasmus Schröder

  • Characterisation of the Medipix3 detector for electron imaging

    Jamil Mir, Jamil Mir, Robert Clough, Ruaraidh MacInnes, Christopher Gough, Richard Plackett, Hide Sawada, Ian MacLaren, Dima Maneuski, Val O'Shea, Damien McGrouther, Angus Kirkland

  • Chiral electron sieves for electron vortex beam generation

    Jun Yuan, Yuanjie Yang, Gnanavel Thirunavukkarasu, Mohamed Babiker

  • Chromatic corrected EFTEM investigation on spinodal decomposition of TiAlN at 80 kV with PICO

    Yen-Ting Chen, Keke Chang, Joachim Mayer, Jochen M. Schneider

  • Coherence of a pulsed electron beam extracted from a semiconductor photocathode in transmission electron microscope

    Makoto Kuwahara, Kouta Aoki, Hiroshi Suzuki, Hidefumi Asano, Toru Ujihara, Koh Saitoh, Nobuo Tanaka

  • ColorSTEM – A Novel STEM Detector for Advanced Materials Analysis in SEM

    Jiří Dluhoš, Michal Bilík, Stanislav Petráš

  • Compressed sensing for beam sensitive materials imaging in Scanning Transmission Electron Microscopy

    Armand Béché, Bart Goris, Bert Freitag, Jo Verbeeck

  • Counter Electrode Design Considerations in Atom Probe Tomography Microscopes

    Robert Ulfig, Dan Lenz, Joseph Bunton, Mike VanDyke, David Larson

  • Crystallite orientation maps of starch granules from polarized Raman spectroscopy and synchrotron X-ray microdiffraction data

    Leonardo Galvis, Carlo Bertinetto, Britta Weinhausen, Nicole Montesanti, Christine Lancelon-Pin, Tapani Vuorinen, Manfred Burghammer, Jean-Luc Putaux

  • Defocus and probe-position coupling in electron ptychography

    Shaohong Cao, Peng Li, Andrew Maiden, John Rodenburg

  • Depth Resolution and Surface Sensitivity with the Multiple Detection System of a HR-SEM

    Ulrich Gernert, Dirk Berger

  • Design and realization of an ultrafast cold field emission source operating under high voltage

    Florent Houdellier, Giuseppe Mario Caruso, Pierre Abeilhou, Arnaud Arbouet

  • Development of a new electrostatic Cs-corrector consisted of annular and circular electrodes

    Tadahiro Kawasaki, Takafumi Ishida, Masahiro Tomita, Tetsuji Kodama, Takaomi Matsutani, Takashi Ikuta

  • Development of low noise quantitative EBAC imaging in FEG SEM

    Grigore Moldovan, Uwe Grauel, Wolfgang Joachimi

  • Development of New Generation Cryo TEM

    Naoki Hosogi, Takeshi Kaneko, Isamu Ishikawa, Syuuiti Yuasa, Kimitaka Hiyama, Naoki Fujimoto, Izuru Chiyo, Akihito Kamoshita, Yoshihiro Ohkura

  • Development of new stage system for modern electron microscopes

    Kazuya Yamazaki, Shuichi Yuasa, Yuuta Ikeda, Masaaki Kobayashi, Kazunori Somehara

  • Device for the transport, storage as well as the chemical or physical treatments of AFM tip series.

    Cédric Gaillard

  • Direct detection and electron counting – A beginning of a new era for electron microscopy

    Ming Pan

  • Dynamic-Transmission Electron Microscopy at the Relativistic Electron Gun for Atomic Exploration (REGAE) for live cell imaging

    Stephanie Manz, Sercan Keskin, Stephanie Besztejan, Benno Zeitler, Sana Azim, Guenther Kassier, Robert Buecker, Deybith Venegas-Rojas, Svenja Riekeberg, Dongfang Zhang, Albert Casandruc, Rolf A. Loch, Yinpeng Zhong, Hossein Delsim-Hashemi, Sascha W. Epp, Klaus Floettmann, Hoc Khiem Trieu, Andrea Rentmeister, R. J. Dwayne Miller

  • « Previous Page
  • 1
  • 2
  • 3
  • 4
  • 5
  • Next Page »

« View all sessions from the The 16th European Microscopy Congress 2016

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Pixelated STEM detectors: opportunities and challenges
  • Atomic relaxation in ultrathin fcc metal nanowires
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Connect with us

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2021 John Wiley & Sons, Inc. All Rights Reserved.
Wiley
This site uses cookies: Find out more.