The 16th European Microscopy Congress 2016 » Instrumentation and Methods » New Instrumentation
Meeting: The 16th European Microscopy Congress 2016
Session: Instrumentation and Methods
Topic: New Instrumentation
Beyond elemental analysis in the electron microscope: accessing isotopes with in-situ TEM-SIMS correlative analysis.
Cathodoluminescence microscopy of biological samples for correlative light and electron microscopy (CLEM) using organic fluorophores
Characterisation of the Medipix3 detector for electron imaging
Chiral electron sieves for electron vortex beam generation
Chromatic corrected EFTEM investigation on spinodal decomposition of TiAlN at 80 kV with PICO
Coherence of a pulsed electron beam extracted from a semiconductor photocathode in transmission electron microscope
ColorSTEM – A Novel STEM Detector for Advanced Materials Analysis in SEM
Compressed sensing for beam sensitive materials imaging in Scanning Transmission Electron Microscopy
Counter Electrode Design Considerations in Atom Probe Tomography Microscopes
Crystallite orientation maps of starch granules from polarized Raman spectroscopy and synchrotron X-ray microdiffraction data
Defocus and probe-position coupling in electron ptychography
Depth Resolution and Surface Sensitivity with the Multiple Detection System of a HR-SEM
Design and realization of an ultrafast cold field emission source operating under high voltage
Development of a new electrostatic Cs-corrector consisted of annular and circular electrodes
Development of low noise quantitative EBAC imaging in FEG SEM
Development of New Generation Cryo TEM
Development of new stage system for modern electron microscopes
Device for the transport, storage as well as the chemical or physical treatments of AFM tip series.
Direct detection and electron counting – A beginning of a new era for electron microscopy
Dynamic-Transmission Electron Microscopy at the Relativistic Electron Gun for Atomic Exploration (REGAE) for live cell imaging
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