The 16th European Microscopy Congress 2016 » Instrumentation and Methods » New Instrumentation

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: New Instrumentation

Beyond elemental analysis in the electron microscope: accessing isotopes with in-situ TEM-SIMS correlative analysis.

Lluis Yedra, Santhana Eswara, David Dowsett, Tom Wirtz
Cathodoluminescence microscopy of biological samples for correlative light and electron microscopy (CLEM) using organic fluorophores

Christopher Schmid, Klaus Yserentant, Lucian Stefan, Dirk-Peter Herten, Rasmus Schröder
Characterisation of the Medipix3 detector for electron imaging

Jamil Mir, Jamil Mir, Robert Clough, Ruaraidh MacInnes, Christopher Gough, Richard Plackett, Hide Sawada, Ian MacLaren, Dima Maneuski, Val O'Shea, Damien McGrouther, Angus Kirkland
Chiral electron sieves for electron vortex beam generation

Jun Yuan, Yuanjie Yang, Gnanavel Thirunavukkarasu, Mohamed Babiker
Chromatic corrected EFTEM investigation on spinodal decomposition of TiAlN at 80 kV with PICO

Yen-Ting Chen, Keke Chang, Joachim Mayer, Jochen M. Schneider
Coherence of a pulsed electron beam extracted from a semiconductor photocathode in transmission electron microscope

Makoto Kuwahara, Kouta Aoki, Hiroshi Suzuki, Hidefumi Asano, Toru Ujihara, Koh Saitoh, Nobuo Tanaka
ColorSTEM – A Novel STEM Detector for Advanced Materials Analysis in SEM

Jiří Dluhoš, Michal Bilík, Stanislav Petráš
Compressed sensing for beam sensitive materials imaging in Scanning Transmission Electron Microscopy

Armand Béché, Bart Goris, Bert Freitag, Jo Verbeeck
Counter Electrode Design Considerations in Atom Probe Tomography Microscopes

Robert Ulfig, Dan Lenz, Joseph Bunton, Mike VanDyke, David Larson
Crystallite orientation maps of starch granules from polarized Raman spectroscopy and synchrotron X-ray microdiffraction data

Leonardo Galvis, Carlo Bertinetto, Britta Weinhausen, Nicole Montesanti, Christine Lancelon-Pin, Tapani Vuorinen, Manfred Burghammer, Jean-Luc Putaux
Defocus and probe-position coupling in electron ptychography

Shaohong Cao, Peng Li, Andrew Maiden, John Rodenburg
Depth Resolution and Surface Sensitivity with the Multiple Detection System of a HR-SEM

Ulrich Gernert, Dirk Berger
Design and realization of an ultrafast cold field emission source operating under high voltage

Florent Houdellier, Giuseppe Mario Caruso, Pierre Abeilhou, Arnaud Arbouet
Development of a new electrostatic Cs-corrector consisted of annular and circular electrodes

Tadahiro Kawasaki, Takafumi Ishida, Masahiro Tomita, Tetsuji Kodama, Takaomi Matsutani, Takashi Ikuta
Development of low noise quantitative EBAC imaging in FEG SEM

Grigore Moldovan, Uwe Grauel, Wolfgang Joachimi
Development of New Generation Cryo TEM

Naoki Hosogi, Takeshi Kaneko, Isamu Ishikawa, Syuuiti Yuasa, Kimitaka Hiyama, Naoki Fujimoto, Izuru Chiyo, Akihito Kamoshita, Yoshihiro Ohkura
Development of new stage system for modern electron microscopes

Kazuya Yamazaki, Shuichi Yuasa, Yuuta Ikeda, Masaaki Kobayashi, Kazunori Somehara
Device for the transport, storage as well as the chemical or physical treatments of AFM tip series.

Cédric Gaillard
Direct detection and electron counting – A beginning of a new era for electron microscopy

Ming Pan
Dynamic-Transmission Electron Microscopy at the Relativistic Electron Gun for Atomic Exploration (REGAE) for live cell imaging

Stephanie Manz, Sercan Keskin, Stephanie Besztejan, Benno Zeitler, Sana Azim, Guenther Kassier, Robert Buecker, Deybith Venegas-Rojas, Svenja Riekeberg, Dongfang Zhang, Albert Casandruc, Rolf A. Loch, Yinpeng Zhong, Hossein Delsim-Hashemi, Sascha W. Epp, Klaus Floettmann, Hoc Khiem Trieu, Andrea Rentmeister, R. J. Dwayne Miller

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