Since its creation at the end of the 1990’s, the EELS and X-ray Absorption Spectroscopy (XAS) database has gathered more than 220 spectra covering 37 elements of the periodic table, becoming the largest open-access electronic repository of spectra from EELS and XAS experiments. The EELS database is now a common tool used by spectroscopists, theoreticians, students and private firms as a reference catalog for fine structures and data-treatment analyzes2-4 and has been referenced by more than 30 papers. Much of this success is due to the open-access nature of the database. The database depends on voluntary user contributions; to encourage these contributions, we have performed a major update of the website.
The EELS and XAS database has been completely rewritten, with an improved design, user interface and a number of new tools. The database is accessible at https://eelsdb.eu/ (Fig. 1) and can now be used without registration. The submission process has been streamlined to encourage spectrum submissions (Fig. 2) and the new design gives greater emphasis on contributors’ original work by highlighting their papers. With numerous new filters and a powerful search function, it is now simple to explore the database of several hundred of EELS and XAS spectra. Interactive plots allow spectra to be overlaid, facilitating online comparison. An application-programming interface has been created, allowing external tools and software to easily access the information held within the database. In addition to the database itself, users can post and manage job adverts and read the latest news and events regarding the EELS and XAS communities. In accordance with the ongoing drive towards open access data increasingly demanded by funding bodies, the database will facilitate open access data sharing of EELS and XAS spectra.5
Acknowledgement: The authors would like to thank the IMN and CEMES laboratories, the European microscopy network ESTEEM 2, the French microscopy network METSA and the French microscopy society Sfµ, for the funding. The authors warmly acknowledge everyone who has contributed to the database.
1. T. Sikora and V. Serin, EMC 2008 14th European Microscopy Congress, pp-439-440, Springer-Verlag Berlin (2008)
2. N. Bernier et al., Materials Characterization, 86, pp-116-126 (2013)
3. L. Zhang et al., Physical Review B, 81, 035102 (2010)
4. R. Núñez-González et al., Computational Materials Science, 49, pp-15-20 (2010)
5. P. Ewels, T. Sikora, V. Serin, C.P. Ewels and L. Lajaunie, Microscopy and Microanalysis, In Press. DOI: 10.1017/S1431927616000179
To cite this abstract:Philip Ewels, Thierry Sikora, Virginie Serin, Chris P. Ewels, Luc Lajaunie; New version of the EELS database: eelsdb.eu. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/new-version-of-the-eels-database-eelsdb-eu/. Accessed: December 3, 2023
EMC Abstracts - https://emc-proceedings.com/abstract/new-version-of-the-eels-database-eelsdb-eu/