EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

Low Voltage Imaging of Defects in 2D-Quantum Materials

Abstract number:

Session Code:

Meeting: The 16th European Microscopy Congress 2016

Session: Materials Science

Topic: 1D and 2D materials

Presentation Form: Poster

Corresponding Email:

David Bell (1, 2), Felix VonCube (1, 3)

1. School of Engineering and Applied Sciences, Harvard University, Cambridge, Etats-Unis 2. Center for Nanoscale Systems, Harvard University, Cambridge , Etats-Unis 3. Hitachi High Technologies , Mannheim, Allemagne

Keywords: 2D materials, Aberration Corrected, Low voltage, Quantum Materials

The discovery of extraordinary new quantum materials with striking properties has caused great excitement, and promises to transform signal processing and computation. We have performed integrated research on three materials (1) Graphene (G) – electrons that move as massless particles at a constant speed; (2) Topological Insulators (TI) – mobile surface electrons with spins fixed to the direction of motion; and (3) Nitrogen-vacancy (NV) Centers in Diamond – a single spin stores a bit of quantum information.  Remarkably, the quantum phenomena displayed by these materials persists at room temperature, changing the rules for signal processing and computation and opening the way for quantum electronics.   

 Defects in materials effect the propagation of electrons and holes in graphene and topological insulators act in ways that are totally unlike carriers in conventional semiconductors – they move like two-dimensional (2D) massless, ultra-relativistic electrons, except their speed is much less than the speed of light. Because there is no bandgap, an electron can pass through a potential barrier by temporarily turning into a hole, dramatically reducing scattering and improving coherence. In addition, for topological insulators the direction of the spin of a surface electron is tied to its direction of motion, providing an ideal means to transport spin information. 

We have imaged and characterized high quality graphene-like materials, such as hexagonal boron nitride (hBN) and hybrid graphene-hBN structures (Fig. 1). Compared with mechanical exfoliation, CVD synthesis [1-2] can provide larger areas, with wafer-scale monolayer or multilayer graphene sheets. Aberration-corrected electron microscopy has been used to characterize MBE-grown films with high resolution at low beam voltages (40 & 80kV) to directly visualize structural defects and relate them to performance.   

We use a Cs corrected Zeiss Libra TEM to investigate chemical vapor deposition (CVD) graphene with added copper and mercury defects. With TEM we address the question, where the Hg and Co atoms are placed on the graphene. At the same time, we observe the effect of the copper and mercury on the pi electrons in graphene with Raman spectroscopy. Furthermore, we are interested in graphene based hybrid structures, such as graphene oxide embedded in a vanadium pentoxide nanofiber matrix (Fig. 2). The graphene sheets and the nanofibers have approximately the same thickness, leading to a material with enhanced mechanical performance in comparison to pure vanadium pentoxide and pure graphene oxide sheets.

Application of Low-Voltage Electron Microscopy and its development and future directions will be presented.

.

References:


Figures:

Figure 1. (top) h-BN and Graphene single layer stack figure showing the structure correlation (bottom) TEM image at 40 keV of a stack showing a single defect.

Figure 2. The image shows the structure of a free-standing thin-film composed of vanadium pentoxide nanofibers and graphene oxide nanosheets. Fibres and sheets both have an average thickness of 1 nm and oxygen-containing functional groups which promote the interaction between both components, leading to a material with enhanced mechanical performance in comparison to pure vanadium pentoxide and pure graphene oxide sheets.

To cite this abstract:

David Bell, Felix VonCube; Low Voltage Imaging of Defects in 2D-Quantum Materials. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/low-voltage-imaging-of-defects-in-2d-quantum-materials/. Accessed: December 3, 2023
Save to PDF

« Back to The 16th European Microscopy Congress 2016

EMC Abstracts - https://emc-proceedings.com/abstract/low-voltage-imaging-of-defects-in-2d-quantum-materials/

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Pixelated STEM detectors: opportunities and challenges
  • Developments in unconventional dark field TEM for characterising nanocatalyst systems

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookie Preferences
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2023 John Wiley & Sons, Inc. All Rights Reserved.
Wiley