Superresolution techniques have pushed the resolution of fluorescence microscopy (FM) towards that of electron microscopy (EM)[1]. Meanwhile, developments in scanning EM (SEM) are revolutionizing EM, moving lateral image dimensions to typical FM fields-of-view[2] and extending imaging capability into the third dimension[3] and the live-cell regime[4]. By correlating data from both techniques[5], molecules can be localized within the context of cells and tissue and with reference to their live dynamics, but throughput and quantification are hindered by elaborate, expert procedures involving separate microscopes. In this presentation, I will show an integrated approach, with high-numerical aperture FM in a SEM, such that the electron beam can be positioned anywhere within the fluorescence field of view[6, 7]. Using electron-beam excited cathodoluminescence from the transparent sample substrate, we achieve automated FM-EM image registration (Fig. 1) with an accuracy that can be pushed to 5 nm, i.e. equalling biomolecular length scales. Besides integrated correlation microscopy, I will show our progress towards novel applications bridging fluorescence and electron microscopy, such as fluorescence-guided live-cell EM[8], and electron-beam identification and localization of labels, molecules, and cells.

[1]   B. Huang, M. Bates, and X. Zhuang, Annual review of biochemistry, 78, 993-1016 (2009).

[2]   R. B. G. Ravelli et al, Scientific Reports 3 (2013)

[3]   C. J. Peddie, and L.M. Collinson, Micron 61, 9-19(2014)

[4]   N. de Jonge, and F. M. Ross, Nature Nanotechnology 6 (11), 695-704 (2011)

[5]   P. de Boer, J.P. Hoogenboom, and B.N.G. Giepmans, Nature Methods 12(6.), 503–513 (2015).

[6]   A.C. Zonnevylle et al., Journal of Microscopy 252, 58-70 (2013).

[7]   N. Liv et al, PLoS ONE 8 (2), e55707 (2013)

[8]   N. Liv et al, ACS Nano 10, 265-273 (2016)

Figures:

Figure 1. Image acquisition and image registration in an integrated microscope. First, (I) FM and (II) SEM images are collected. By (III) positioning the electron beam on specific positions in the EM field of view and recording electron-excited luminescence, EM coordinates can be mapped to corresponding FM coordinates. This generates (IV) an overlay image. Right: Example of the distortions between FM and SEM coordinate systems, measured over a large (FM) field-of-view using procedure (III). Tissue sample courtesy of P. de Boer, B. Giepmans (UMC Groningen). Data: Haring et al, manuscript under review.

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