EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

Electrical transport-induced transformations in filled carbon nanotubes imaged in situ by scanning-transmission electron microscopy

Abstract number: 6531

Session Code: IM02-171

DOI: 10.1002/9783527808465.EMC2016.6531

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Micro-Nano Lab and dynamic microscopy

Presentation Form: Poster

Corresponding Email: juan.lozano@materials.ox.ac.uk

Juan G Lozano (1), Zabeada Aslam (1), Rebecca J Nicholls (1), Antal A Koos (1), Frank Dillon (1), Michael Sarahan (2), Peter D Nellist (1), Nicole Grobert (1)

1. Department of Materials, University of Oxford, Oxford, Royaume Uni 2. SuperSTEM Laboratory, STFC Daresbury, Daresbury, Royaume Uni

Keywords: CNTs, in-situ, STEM

Fe-filled CNTs have been proposed as perfect candidates for a large and varied number of applications, ranging from the biological to optoelectronics or memory storage devices 1. For any of these applications, it seems crucial to understand the interactions, possible phase changes or reactions that can take place as a consequence of exposure to their real working conditions.

Conventional bright-field transmission electron microscopy (BF-TEM) has been the tool traditionally employed to observe in-situ the dynamical effects that take place when individual CNTs are exposed to high electrical currents and Joule heating. Despite being a much more powerful technique, scanning TEM-annular dark field (STEM-ADF) imaging has been scarcely for this purpose 2. One of the main advantages of STEM-ADF over BF-TEM is that the intensity in the images is highly dependent on the atomic number of the species which are present and therefore the images show compositional in addition to structural information. This gives a much better understanding of current-induced migration effects, formation of intermediate phases or alloying, or phase separation phenomena, something that using BF-TEM alone would miss. In the STEM-ADF configuration it is also possible to perform complementary analytical spectroscopy simultaneously with imaging and with comparable spatial resolution.

Here we show the significant advantages of combining in-situ experiments with STEM-ADF and related analytical techniques to gain new insights into the electrical transport induced transformations in P, N doped Fe-filled carbon nanotubes. It has been possible to monitor in real time a multistage process (Figure 1) in which the Fe filling reacts with nitrogen to form an intermediate alloy phase, which then decomposes into smaller particles. The presence of N2 gas within the inner channel of the tube is found to be crucial to this process.

 

  1. S. Costa et al.,  Phys. Stat. Sol. B 2007, 244, 4315-4318.
  2. Y. Beyer et al., Micron 2012, 43, 428–434.

Figures:

A sequence of STEM-ADF images showing a) the initial Fe-filling in a unchanged during stage 1; followed by the formation of a intermediate contrast particle in (b) and (c); and (d) its conversion back to particles

To cite this abstract:

Juan G Lozano, Zabeada Aslam, Rebecca J Nicholls, Antal A Koos, Frank Dillon, Michael Sarahan, Peter D Nellist, Nicole Grobert; Electrical transport-induced transformations in filled carbon nanotubes imaged in situ by scanning-transmission electron microscopy. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/electrical-transport-induced-transformations-in-filled-carbon-nanotubes-imaged-in-situ-by-scanning-transmission-electron-microscopy/. Accessed: September 25, 2023
  • Tweet
  • Email
  • Print
Save to PDF

« Back to The 16th European Microscopy Congress 2016

EMC Abstracts - https://emc-proceedings.com/abstract/electrical-transport-induced-transformations-in-filled-carbon-nanotubes-imaged-in-situ-by-scanning-transmission-electron-microscopy/

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Pixelated STEM detectors: opportunities and challenges
  • Developments in unconventional dark field TEM for characterising nanocatalyst systems

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Connect with us

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookie Preferences
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2023 John Wiley & Sons, Inc. All Rights Reserved.
Wiley