We present recent progress in correlative methods for the joint analysis of samples by Atom Probe Tomography (LEAP 3000, LEAP 5000) and Electron Microscopy (Cs corrected Titan Themis). Measurements are conducted on the same Atom Probe sample tips and in some cases atomic resolution is reached.
Examples from functional and structural energy-related materials are presented including segregation effects in multicrystalline silicon solar cells and their relation to cell efficiency (Fig. 1), superalloys for advanced turbines and high strength steels (Fig. 2).
To cite this abstract:Andreas Stoffers, Christian Liebscher, Pyuck-Pa Choi, Michael Herbig, Christina Scheu, Gerhard Dehm, Ivan Povstugar, Dierk Raabe; Correlative atom probe tomography and electron microscopy on energy materials. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/correlative-atom-probe-tomography-and-electron-microscopy-on-energy-materials/. Accessed: April 3, 2020
EMC Abstracts - https://emc-proceedings.com/abstract/correlative-atom-probe-tomography-and-electron-microscopy-on-energy-materials/