The chemistry of internal interfaces plays a key role in modern physical metallurgy, in particular for the development of the new generations of steels. Despite the tremendous instrumental developments over the last decade, the atomic scale characterization of these interfaces in steels is still a very challenging problem.
Analytical electron microscopy (EDX and EELS in STEM mode) and atom probe tomography are the two techniques presenting spatial and analytical resolutions suitable for such characterizations. Their respective advantages and complementarity will be illustrated on the basis of quantitative determination of segregated amounts of interstitial and substitutional elements at interfaces, with particular emphasis on the intensive specimen preparation efforts required to reach their ultimate capabilities.
To cite this abstract:F. Danoix, X. Sauvage, M. Gouné, B. Gault , F. Cuvilly; Analytical electron microscopy and atom probe tomography investigation of interfacial segregation. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/analytical-electron-microscopy-and-atom-probe-tomography-investigation-of-interfacial-segregation/. Accessed: April 3, 2020
EMC Abstracts - https://emc-proceedings.com/abstract/analytical-electron-microscopy-and-atom-probe-tomography-investigation-of-interfacial-segregation/