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Analytical electron microscopy and atom probe tomography investigation of interfacial segregation

Abstract number: 7045

Session Code: IM10-125

DOI: 10.1002/9783527808465.EMC2016.7045

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: Correlative microscopy

Presentation Form: Poster

Corresponding Email: Frederic.Danoix@univ-rouen.fr

F. Danoix (1), X. Sauvage (1), M. Gouné (2), B. Gault (3), F. Cuvilly (1)

1. GPM UMR CNRS 6634 , Université de Rouen Normandie, Rouen, France 2. UPR CNRS 9048 , ICMCB Bordeaux , Pessac, France 3. Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf , Allemagne

Keywords: Analytical electron microscopy, Atom probe tomography, focussed ion beam, interfaces, steels, transmission Kikushi dffraction

The chemistry of internal interfaces plays a key role in modern physical metallurgy, in particular for the development of the new generations of steels. Despite the tremendous instrumental developments over the last decade, the atomic scale characterization of these interfaces in steels is still a very challenging problem.

Analytical electron microscopy (EDX and EELS in STEM mode) and atom probe tomography are the two techniques presenting spatial and analytical resolutions suitable for such characterizations. Their respective advantages and complementarity will be illustrated on the basis of quantitative determination of segregated amounts of interstitial and substitutional elements at interfaces, with particular emphasis on the intensive specimen preparation efforts required to reach their ultimate capabilities. 

Figures:

Figure 1: Atom probe specimen, with a ferrite-martensite interface, preparation using TKD

Figure 2: Direct comparison between AEM and APT of Mn segregation at ferrite-martensite interface

To cite this abstract:

F. Danoix, X. Sauvage, M. Gouné, B. Gault , F. Cuvilly; Analytical electron microscopy and atom probe tomography investigation of interfacial segregation. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/analytical-electron-microscopy-and-atom-probe-tomography-investigation-of-interfacial-segregation/. Accessed: September 21, 2023
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