EMC Abstracts

Official abstracts site for the European Microscopy Congress

MENU 
  • Home
  • Meetings Archive
    • The 16th European Microscopy Congress 2016
  • Keyword Index
  • Your Favorites
    • Favorites
    • Login
    • Register
    • View and Print All Favorites
    • Clear all your favorites
  • Advanced Search

A protected inert-gas sample manipulation and transfer environment for cryo electron microscopy and analytics

Abstract number: 6758

Session Code: IM03-269

DOI: 10.1002/9783527808465.EMC2016.6758

Meeting: The 16th European Microscopy Congress 2016

Session: Instrumentation and Methods

Topic: New Instrumentation

Presentation Form: Poster

Corresponding Email: rosenthal@microscopyimprovements.at

Georg Alexander Rosenthal (1), Sebastian Tacke (2), Falk Lucas (3), Roger Albert Wepf (4)

1. Microscopy Improvements e.U., Eisenstadt, Autriche 2. Institute of Medical Physics and Biophysics, University of Münster, Zurich, Suisse 3. ScopeM, ETH Zürich, Zürich, Suisse 4. Centre for Microscopy & Microanalysis, University of Queensland, St. Lucia, Australie

Keywords: analytics, cryo, electron microscopy, protected environment, sample, sample manipulation

The preservation of the native sample state during manipulation and exchange between sample preparation and imaging devices is a prerequisite for artefact and contamination free structure investigation. In particular during cryo-transfer and (re-)mounting of frozen hydrated samples, which often in electron microscopy (EM), have a very large surface area compared to its volume, can be very challenging when samples have to be exchanged or remounted several times. Some of the main challenges are: 1. preventing the sample from warming up to the de-vitrification temperature of water (approximately -137°C), 2. Preventing the sample from being covered with ice or other contaminants condensing from the surrounding atmosphere and 3. Handling these samples without chemical or mechanical alteration of their native state.

Currently the handling and transfer of samples under vacuum and cryo conditions is solved by systems provided from different suppliers. However the transfer of frozen (vitrified) samples under environmental pressure (e.g. from a high-pressure-machine to a low temperature coater or cryo-EM) is still a challenge and a satisfactory practical solution is missing.

Here, we present an ambient pressure inert-gas sample mounting and exchange chamber (Glove-Box) (Fig. 1 &B) that addresses all the needs for structure and composition preservation during the manipulation, mounting and transfer of mainly frozen or hydration/oxygen sensitive samples. Once mounted these samples can be transferred and exchanged between different cryo-preparation and imaging systems (Fig. 1 E) under controlled inert-gas and temperature conditions. This controlled inert-gas “Glove-Box” includes a LN2 immersed sample mounting area with various interfaces to different inert-gas/cryo transfer systems for RT or low temperature TEM or FIB/SEM applications, Furthermore, monitoring of the environmental parameters (Fig. 1 C) during transfer (humidity, oxygen, carbon dioxide), on-screen imaging to support sample manipulation (Fig. 1 D), heating of tools and recording of all experimental parameters for documentation are included into this dedicated LN2 and inert-gas “Glove-Box”. The interface to other sample carrier devices is open and flexible and can be adapted upon individual laboratory needs. Finally such a “Glove-Box” can play an essential role in a dedicated modern cryo-EM & analytical environment as sketched in Fig. 1 E.

Figures:

To cite this abstract:

Georg Alexander Rosenthal, Sebastian Tacke, Falk Lucas, Roger Albert Wepf; A protected inert-gas sample manipulation and transfer environment for cryo electron microscopy and analytics. The 16th European Microscopy Congress, Lyon, France. https://emc-proceedings.com/abstract/a-protected-inert-gas-sample-manipulation-and-transfer-environment-for-cryo-electron-microscopy-and-analytics/. Accessed: September 22, 2023
  • Tweet
  • Email
  • Print
Save to PDF

« Back to The 16th European Microscopy Congress 2016

EMC Abstracts - https://emc-proceedings.com/abstract/a-protected-inert-gas-sample-manipulation-and-transfer-environment-for-cryo-electron-microscopy-and-analytics/

Most Viewed Abstracts

  • mScarlet, a novel high quantum yield (71%) monomeric red fluorescent protein with enhanced properties for FRET- and super resolution microscopy
  • 3D structure and chemical composition reconstructed simultaneously from HAADF-STEM images and EDS-STEM maps
  • Layer specific optical band gap measurement at nanoscale in MoS2 and ReS2 van der Waals compounds by high resolution electron energy loss spectroscopy
  • Pixelated STEM detectors: opportunities and challenges
  • Developments in unconventional dark field TEM for characterising nanocatalyst systems

Your Favorites

You can save and print a list of your favorite abstracts by clicking the “Favorite” button at the bottom of any abstract. View your favorites »

Visit Our Partner Sites

The 16th European Microscopy Congress

The official web site of the 16th European Microscopy Congress.

European Microscopy Society

European Microscopy Society logoThe European Microscopy Society (EMS) is committed to promoting the use and the quality of advanced microscopy in all its aspects in Europe.

International Federation of Societies for Microscopy

International Federation of Societies for Microscopy logoThe IFSM aims to contribute to the advancement of microscopy in all its aspects.

Société Française des Microscopies

Société Française des MicroscopiesThe Sfµ is a multidisciplinary society which aims to improve and spread the knowledge about Microscopy.

Connect with us

Imaging & Microscopy
Official Media Partner of the European Microscopy Society.

  • Help & Support
  • About Us
  • Cookie Preferences
  • Cookies & Privacy
  • Wiley Job Network
  • Terms & Conditions
  • Advertisers & Agents
Copyright © 2023 John Wiley & Sons, Inc. All Rights Reserved.
Wiley