The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

X-ray absorption in pillar shaped TEM specimens

Hugo Bender, Paola Favia, Yang Qiu, Olivier Richard
X-ray emission generation constant from mono-layer graphene measured using STEM-EDS map detected with highly sensitive EDS system.

Yu Jimbo, Takeo Sasaki, Hidetaka Sawada, Eiji Okunishi, Yukihito Kondo
XTEM observations revealing high diffusivity and Ge segregation in UV laser pulse annealed SiGeO and GeTiO amorphous films

Valentin Serban Teodorescu, Valentin Serban Teodorescu, Adriaan Valentin Maraloiu, Andrei Kuncser, Corneliu Ghica, Magdalena Lidia Ciurea, Ana-Maria Lepadatu, Ionel Stavarache, Doinel Nicolae Scarisoreanu, Marie-Genevieve Blanchin, Ana-Maria Dinescu