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The 16th European Microscopy Congress 2016

August 28 - September 2, 2016 in Lyon, France

View by Title View Sessions View by Presentation Form
Jump to:  View All • a b c d [e] f g h i j k l m n o p q r s t u v w x y z
  • Eavesdropping on the molecular signatures of embryonic development

    Scott Fraser

  • EBSD Analysis of the Microstructural Evolution of Ni-Superalloys

    Matjaž Godec, Jaka Burja, Bojan Podgornik, Franc Tehovnik

  • EBSD measurements on the weld seam area of differently extruded ME21 hollow profiles

    Christoph Fahrenson, Felix Gensch, Sven Gall, Dirk Berger

  • EDF Project – FIB-SEM nuclearized for investigations in a hot cell on irradiated materials

    salem MILOUDI, Jean-Claude MENARD, Bernard JEAN, Antoine CANDEIAS

  • EDS/EBSD studies and HR-EBSD pattern analysis on pre-Inca ceramic fragments recovered during San José de Moro Archaeology Program

    Dagmar Dietrich, Gert Nolze, Thomas Mehner, Daniela Nickel, Thomas Lampke

  • EDX-STEM phase mapping of semiconductor devices using multivariate statistical analysis tools

    Zineb Saghi, Patricia Pimenta-Barros, Gael Goret, Tony Printemps, Nicolas Bernier, Sylvain Barraud, Vincent Delaye

  • EELS analysis of cation intermixing around LaAlO3/SrTiO3 interfaces

    Hicham Zaid, Marie-Hélène Berger, Richard Akrobetu, Alp Sehirlioglu, Denis Jalabert, Michael Walls

  • EELS analysis of He bubbles in ODS Steel and vanadium

    Michael Walls, Nathalie Brun, Vincent Badjeck

  • EELS analysis of the interaction betweeen frozen acqueous samples and incident electrons in TEM

    Alan Maigne, Matthias Wolf

  • EELS Investigation of the Work Function Reduction in Au decorated ZnO Nanotapers

    Avanendra Singh, Paolo Longo, Kartik Senapati, Ray Twesten, Pratap Sahoo

  • EELS Observation on Spontaneously Grown Ag@Titanium Oxide Core Shell Nanowires

    Jenn-Ming Song, Chi-Hang Tsai, Shih-Yun Chen, Alexandre Gloter

  • EELS Probing of lithium based 2-D battery compounds processed by liquid phase exfoliation

    Anuj Pokle, João Coelho, Eva Macguire, Clive Downing, Patrick Casey, Cormac McGuinness, Valeria Nicolosi

  • EELS simulations in III-Nitride ternary alloys by DFT

    Alberto Eljarrat Ascunce, Xavier Sastre, Sònia Estradé, Francesca Peiró

  • Effect of Alloying Content on the Defect Structure Formation and Evolution in the Ta-W system

    Iuliia Ipatova, Enrique Jimenez-Melero

  • Effect of amorphous surface layers on HRTEM image evaluation

    Thilo Remmele, Tobias Schulz, Martin Albrecht

  • Effect of electron dose density on silicon nitride compared between two different atomic column elemental maps by 2D moiré and conventional methods

    Yukihito Kondo, Eiji Okunishi

  • Effect of grain size, precipitation and texture on mechanical and corrosion properties of ECAPed AZ80

    Yau Yau Tse, Kaiyuan Zhang, Yang Du, Diana Maradze, Yang Liu

  • Effect of processing parameters on microstructure and mechanical properties of additively manufactured stainless steel

    Kaushik Vaideeswaran, Olha Sereda, Youness Zangui, Hervé Saudan, Lionel Kiener, Massoud Dadras

  • Effect of Systemic D Vitamin Supplementation on The Treatment of Full Thickness Articular Cartilage Defects

    Okan Tok, Tuğba Ekiz Yılmaz, Elif Güzel, Önder Aydıngöz, Mehmet Can Ünlü

  • Effect of Ti addition in refinement of oxide dispersoids in Fe-Y2O3-Ti model ODS alloys during milling and subsequent annealing

    Pradyumna Kumar Parida, Arup Dasgupta, K. G. Raghavendra, Sujay Chakravarty, K Jayasankar, Saroja Saibaba

  • Effect of trace elements on the material properties of an aluminium casting alloy

    Hartmuth Schroettner, Thomas Pabel, Tose Petkov, Sabrina Mertschnigg, Anita Rossmann-Perner

  • Effect on the SEM topography of different sample preparation methods for thin-film-composite membrane

    Wenqing Huang, Xiaopei Miao

  • Effects and implications of photon reabsorption phenomena on confocal micro-photoluminescence measurements in crystalline Si

    Abel Roigé, Alexandre Jaffré, José Alvarez, Thibaut Desrues, Delfina Muñoz, Isidro Martín, Ramon Alcubilla, Jean-Paul Kleider

  • Effects of dose and image registration on exit wave reconstruction of low-dose focal series

    Chen Huang, Hidetaka Sawada, Angus Kirkland

  • Effects of electron-beam-generated anion point defects on the long range order of charge density waves in 1T-TaSe2, 1T-TaS2

    Michael Kinyanjui, Pia Boerner, Tibor Lehnert, Janis Koster, Ute Kaiser

  • Effects of instrument imperfections on quantitative scanning transmission electron microscopy

    Marco Schowalter, Florian Fritz Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, Andreas Rosenauer

  • Efficient and quantitative phase imaging in two- and three-dimensions using electron ptychography in STEM

    Peter Nellist, Hao Yang, Lewys Jones, Gerardo Martinez, Reida Rutte, Benjamin Davis, Timothy Pennycook, Martin Simson, Martin Huth, Heike Soltau, Lothar Strueder, Ryusuke Sagawa, Yukihito Kondo, Martin Humphry

  • Efficient generation of electron Bessel beams using generic magnetic vortex structures

    Changlin Zheng, Timothy C Petersen, Holm Kirmse, Wolfgang Neumann, Joanne Etheridge

  • Efficient motor neuron targeting in adult mice by a single lumbar intrathecal rAAV9-eGFP administration: application for motor neuron diseases.

    Karim Bey, Johan Deniaud, Ciron Carine, Laurence Dubreil, Patrick Aubourg, Marie-Anne Colle

  • EFTEM measurements of the sp2/sp3 ratio on SiC/SiC pyrolytic carbon interphases before and after irradiation

    Loïc Fave, Cécile Hébert, Manuel Alexandre Pouchon

  • Elastic delocalization in EELS

    Stefan Löffler

  • Electrical properties of atomic carbon chains measured by in-situ TEM

    Florian Banhart, Alessandro La Torre, Ferdaous Ben Romdhane, Ovidiu Cretu, Andrés Botello-Mendez, Jean-Christophe Charlier

  • Electrical transport-induced transformations in filled carbon nanotubes imaged in situ by scanning-transmission electron microscopy

    Juan G Lozano, Zabeada Aslam, Rebecca J Nicholls, Antal A Koos, Frank Dillon, Michael Sarahan, Peter D Nellist, Nicole Grobert

  • Electron beam drilling rates of silicon crystal measured on various accelerating voltages and probe currents

    Noriaki Endo, Yukihito Kondo

  • Electron beam induced in situ writing and recovering of vacancy layers in Ge2Sb2Te5 crystal lattice

    Andriy Lotnyk, Sabine Bernütz, Xinxing Sun, Ulrich Ross, Martin Ehrhardt, Bernd Rauschenbach

  • Electron beam lithography for the realization of electron beam vortices with large topological charge ( L=1000ħ)

    Erfan Mafakheri, Amir Tavabi, Penghan Lu, Roberto Balboni, Federico Venturi, Claudia Menozzi, Gian Carlo Gazzadi, Stefano Frabboni, Robert Boyd, Rafal Dunin-Borkowski, Ebrahim Karimi, Vincenzo Grillo

  • Electron beam-induced etching of carbon nanotubes by environmental transmission electron microscope

    Yuto Tomita, Hideto Yoshida, Seiji Takeda

  • Electron diffractive imaging using fork-shaped grating masks

    Saitoh Koh, Nambu Hiroki, Uchida Masaya

  • Electron diffuse scattering in BNT-BKT-BT ternary compound

    Alexandra Neagu, Cheuk-Wai Tai

  • Electron energy loss spectroscopy (EELS) fingerprints of p- and n-type doping in graphene

    Demie Kepaptsoglou, Trevor Hardcastle, Che Seabourne, Ursel Bangert, Recep Zan, Julian Amani, Hans Hofsäss, Rebecca Nicholls, Rik Brydson, Andrew Scott, Quentin Ramasse

  • Electron holography by means of tilted reference waves

    Falk Röder, Axel Lubk, Florent Houdellier, Thibaud Denneulin, Etienne Snoeck, Martin Hÿtch

  • Electron interferometry techniques for strain analysis using a multi-biprism microscope

    Thibaud Denneulin, Falk Röder, Florent Houdellier, Christophe Gatel, Etienne Snoeck, Martin Hÿtch

  • Electron microscopic characterization of thermally modified surface layers generated by electro-discharge machining

    Lisa Ehle, Sebastian Schneider, Alexander Schwedt, Silvia Richter, Joachim Mayer

  • Electron microscopy analysis of flash-annealed CuZr based bulk metallic glass

    Christoffer Müller, Christian Ebner, Christoph Gammer, Konrad Kosiba, Benjamin Escher, Simon Pauly, Jürgen Eckert, Christian Rentenberger

  • Electron microscopy approaches to studying lipid–protein interactions

    Thomas Walz

  • Electron microscopy characterization of the wear of textured α-Al2O3 and κ-Al2O3-TiN multilayer coatings for cutting tool applications

    Ernesto Coronel, Arno Meingast, Babak Rabiei, Jeanette Persson, Martina Lattemann

  • Electron microscopy characterization of yttrium-doped barium zirconate electrolytes prepared with Ni additive: Influence of hydrogen treatment

    Paul HAGHI-ASHTIANI, Mohamed BEN HASSINE, Desiree CIRIA, Manuel JIMENEZ-MELENDO, Veronique AUBIN, Guilhem DEZANNEAU

  • Electron microscopy investigations of cation exchange in colloidal PbSe/CdSe nanocrystals

    Anil Yalcin, Bart Goris, Zaochuan Fan, Thijs Vlugt, Alfons van Blaaderen, Daniel Vanmaekelbergh, Sara Bals, Marijn van Huis

  • Electron Microscopy of Copper Nanoparticle Growth

    Christian F. Elkjær, Roy van den Berg, Cedric J Gommes, Ib Chorkendorff, Jens Sehested, Petra E. de Jongh, Krijn P. de Jong, S Helveg

  • Electron microscopy of novel technical superconducting materials

    Alexander Vasiliev, Igor Karateev, Mikhail Kovalchuk, Mikhail Presnyakov

  • Electron microscopy studies of Silicon Radial junction for stable and highly efficient thin film solar cells

    Ileana Florea, Soumyadeep Misra, Martin Foldyna, Raul Arenal, Jean-Luc Maurice, Linwei Yu, Pere Roca i Cabarrocas

  • Electron Radiolytic Triggering Metal-Insultor Transformation in VO2 Nanowire

    Zhen-Hua Zhang, Hua Guo, Wen-Qiang Ding, Xiao-Xiang Ke, Fu-Rong Chen, Man-Ling Sui

  • Electron tomography analysis of Pt/CeO2 catalyst powders synthesized by solution combustion

    Lucian Roiban, Siddardha Koneti, Thierry Epicier, Thanh-Son Nguyen, Mimoun Aouine, Franck Morfin, Laurent Piccolo

  • Electron Tomography at the Frontiers of Materials Chemistry

    Rowan Leary

  • Electron tomography based on highly limited data using a neural network reconstruction technique

    Eva Bladt, Daniel Pelt, Joost Batenburg, Sara Bals

  • Electron tomography combined with electron diffraction reveals the dissolution and phase transformation of KFI to CHA zeolites

    Tom Willhammar, Leen van Tendeloo, Eric Breynaert, Johan Martens, Christine Kirschhock, Sara Bals

  • Electron Tomography of entrapped iron nanoparticles in silicalite-1 (Fischer-Tropsch catalyst)

    Siddardha Koneti, Lucian Roiban, David Farrusseng, Joffrey Huve, Thierry Epicier

  • Electron tomography with sub-5-second temporal resolution for dynamic in situ transmission electron microscopy

    Vadim Migunov, Rowan K. Leary, María de la Mata, Eleonora Russo-Averchi, Gözde Tütüncüoglu, Anna Fontcuberta i Morral, Jordi Arbiol, Rafal E. Dunin-Borkowski

  • Electron tomography: influence of defocus on the determination of reconstructed soot aggregates’ surface and volume

    Martiane Cabié, Marc Gailhanou, Daniel Ferry

  • Electron-beam induced fluorescence superresolution with 100nm resolution in CLEM on labelled tissue sections

    Lennard M. Voortman , Aditi Srinivasa Raja, Aaro Väkeväinen, Pascal de Boer, Ben N.G. Giepmans, Pieter Kruit, Jacob P. Hoogenboom

  • Electron-beam-induced structural phase transition related to oxygen vacancy ordering in epitaxial La2/3Sr1/3MnO3 films

    Lide Yao, Sayani Majumdar, Laura Äkäslompolo, Sampo Inkinen, Qi Hang Qin, Sebastiaan van Dijken

  • Element partitioning and atom location of alloying elements in Co‐base superalloys

    Li Wang, Michael Oehring, Uwe Lorenz, Florian Pyczak

  • Elemental mapping of perovskite solar cells using STEM and multivariate analysis

    Stefania Cacovich, Giorgio Divitini, Fabio Matteocci, Yan Busby, Jean-Jacques Pireaux, Aldo Di Carlo, Caterina Ducati

  • EMCD investigation of the Verwey-transition in magnetite

    Walid Hetaba, Michael Stöger-Pollach

  • En route to ion microprobe analysis of soluble compounds at the single cell level: The CryoNanoSIMS

    Louise Helene Søgaard Jensen, Tian Cheng, Florent Olivier Vivien Plane, Stéphane Escrig, Arnaud Comment, Ben van den Brandt, Bruno Martin Humbel, Anders Meibom

  • Enabling and doing structural biology in situ

    Juergen Plitzko, Julia Mahamid, Benjamin Engel, Sahradha Albert, Miroslava Schaffer, Jan Arnold, Yoshiyuki Fukuda, Maryam Khoshouei, Radostin Danev, Wolfgang Baumeister

  • Enamel evolution: Back in time by a molecular manipulation

    Tomas Wald, Frantisek Spoutil, Adriana Osickova, Michaela Prochazkova, Oldrich Benada, Petr Kasparek, Ladislav Bumba , Ophir Klein, Radislav Sedlacek , Peter Sebo, Jan Prochazka, Radim Osicka

  • Energy dispersive x-ray analysis of platinum-nickel nanoparticles embedded in hollow graphitic spheres used as fuel-cell catalysts

    Ann-Christin Swertz, Stefano Mezzavilla, Norbert Pfänder, Ferdi Schüth, Christian W. Lehmann

  • Engineering the Contrast Transfer through the Cc/Cs Corrected 20−80 kV SALVE Microscope

    Felix Börrnert, Johannes Biskupek, Zhongbo Lee, Martin Linck, Peter Hartel, Heiko Müller, Maximilian Haider, Ute Kaiser

  • Environmental (S)TEM analysis of Fe nanoparticles under oxygen atmosphere

    Leonardo Lari, Robert Carpenter, Vlado Lazarov, Pratibha Gai, Ed Boyes

  • Environmental issues addressed by analytical TEM and X-rays absorption spectroscopies

    Yuheng WANG , Areej ADRA , Maya IKOGOU , Georges ONA-NGUEMA, Farid JUILLOT , Nicolas MENGUY, Guillaume MORIN

  • Environmental Scanning Electron Microscopy applied to the identification of asbestos fibers in histological sections

    Caterina Rinaudo, Alessandro Croce, Nicol Francesca Trincheri, Roberta Libener, Daniela Degiovanni, Federica Grosso

  • Environmental tomography of liquid latex suspensions in STEM

    Juan XIAO, Lucian ROIBAN, Genevieve FORAY-THEVENIN, Karine MASENELLI-VARLOT

  • Environmental Transmission Electron Tomography: fast 3D analysis of nano-materials

    Siddardha Koneti, Lucian Roiban, Voichita Maxim, Thomas Grenier, Priscilla Avenier, Amandine Cabiac, Anne-Sophie Gay, Florent Dalmas, Thierry Epicier

  • Epitaxial BaTiO3 on Si and SiGe for low power devices: nanoscale characterization of the film and its interface with the semiconductor by HAADF and EELS in STEM

    Sylvie Schamm-Chardon, Cesar Magen, Lucie Mazet, Robin Cours, Martin Frank, Vijay Narayanan, Catherine Dubourdieu

  • Epitaxy of GaN nanowires on graphene

    Vishnuvarthan Kumaresan, Ludovic Largeau, Ali Madouri, Frank Glas, Hezhi Zhang, Fabrice Oehler, Antonella Cavanna, Andrey Babichev, Noelle Gogneau, Maria Tchernycheva, Jean-Christophe Harmand

  • Evaluation of antibacterial mechanism of polymeric nano-particles by scanning transmission electron microscopy-cathodoluminescence technique

    Chisato Takahashi, Noriko Ogawa, Shunsuke Muto, Yoshiaki Kawashima, Hiromitsu Yamamoto

  • Evaluation of Electron Microscopy Techniques for the Purpose of Classification of Nanomaterials

    Johannes Mielke, Frank Babick, Toni Uusimäki, Philipp Müller, Eveline Verleysen, Vasile-Dan Hodoroaba

  • Evaluation of feature-based registration algorithms for the improvement of tilt-series alignment in electron tomography

    Amandine Verguet, Sylvain Trepout, Sergio Marco, Cédric Messaoudi

  • Evaluation of local atomic arrangements and lattice distortions in layered Ge-Sb-Te crystal structures

    Andriy Lotnyk, Ulrich Ross, Sabine Bernütz, Erik Thelander, Bernd Rauschenbach

  • Evidence for the dissolution of molybdenum during tribocorrosion of CoCrMo alloy in the presence of serum proteins

    Thiago Simoes, Michael Bryant, Andy Brown, Steve Milne, Mary Ryan, Angela Goode, Alexandra Porter, Anne Neville, Rik Brydson

  • Evidence of metastable zinc blende phase and its influence in nanocrystalline ZnO film growth

    Arthur Brian Aebersold, Duncan Alexander, Cécile Hébert

  • Examination of inas/insb heterointerfaces in nanowires

    Aske Gejl, Thomas Kanne, Erik Johnson, Thibaud Denneulin, Wolfgang Jäger, Jesper Nygård, Peter Krogstrup

  • Examination Of Retinoic Acid And Oct3/4 Relationship In Gonadal Development

    Merve Albayrak, Leyla Tapul

  • Examination of semiconducting properties of oxides in the vicinity of metal-oxide interfaces for selected alloys

    Radovan Vanta, Sousan Abolhassani, M Dadras

  • Exchange-coupled Sm–Co/Co thin layers; structural and magnetic investigations

    Marwen Hannachi, Wajdi Belkacem, Martiane Cabié, Lotfi Bessais, Najeh Mliki

  • Exchange-coupled spinel oxides: micro-Raman and in field Mossbauer spectroscopies correlated to HRTEM.

    mohamed Saidani, Wajdi Belkacem, Jean François Bardeau, Adrian Bezerghianu, Loic Patout, Jena Marc Greneche, Najeh Mliki

  • Excitation and probing of hyperbolic phonon polaritons in hexagonal boron nitride structures by fast electrons

    Andrea Konečná, Alexander Govyadinov, Andrey Chuvilin, Irene Dolado, Saül Vélez, Javier Aizpurua, Rainer Hillenbrand

  • Exciton and Plasmon Mapping at the Nanoscale

    Hannah Nerl, Kirsten Winther, Fredrik Hage, Kristian Thygesen, Lothar Houben, Quentin Ramasse, Valeria Nicolosi

  • Excitonic Properties of Inorganic-Organic Hybrid Perovskites and Nanophotonic Devices

    Qihua Xiong

  • Exotic Electron topologies – Knitting with electron vortices

    Laura Clark, Jo Verbeeck

  • Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM)

    Aakash Varambhia, Lewys Jones, Annick De Backer, Vidar Fauske, Sandra Van Aert, Dogan Ozkaya, Sergio Lozano-Perez, Peter Nellist

  • Experimental determination of electron-beam broadening in low-energy STEM

    Holger Drees, Erich Müller, Dagmar Gerthsen

  • Experimental Determination of the Solid Angle of EDXS Detectors

    Judith Lammer, Johanna Kraxner, Werner Grogger

  • Exploration of non-radioactive alternative stains to uranyl acetate

    Kanako Inoue, Yoshinori Muranaka, Pyoyun Park, Hidehiro Yasuda

  • Exploring and Tailoring Structural Properties of the Two-Dimensional Family ofMXenes

    Per Persson

  • Exposing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data

    Andrew Yankovich, Torben Pingel, Jie Feng, Alex Kvit, Thomas Slater, Sarah Haigh, Dane Morgan, Paul Voyles, Eva Olsson

  • Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

    Martin Simson, Rafal E. Dunin-Borkowski, Robert Hartmann, Martin Huth, Sebastian Ihle, Lewys Jones, Yukihito Kondo, Vadim Migunov, Peter D. Nellist, Robert Ritz, Henning Ryll, Ryusuke Sagawa, Julia Schmidt, Heike Soltau, Lothar Strüder, Hao Yang

  • Extreme Nanowires: The Smallest Crystals in the Smallest Nanotubes

    Jeremy Sloan, Reza Kashtiban, Sam Marks, Richard Beanland, Ana Sanchez, Sam Brown, Andrij Vasylenko, Peter Brommer, Krzysztof Morawiec, Slawomir Kret, Paulo Medeiros, James Wynn, Joe Spencer, David Smith, Quentin Ramasse, Zheng Liu, Kazu Suenaga, Andrew Morris, David Quigley, Eric Faulques

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